Organized by 𝐁𝐫𝐮̈𝐭𝐬𝐜𝐡/𝐑𝐮̈𝐞𝐠𝐠𝐞𝐫, SMACA SA, 𝐒𝐲𝐥𝐯𝐚𝐜 and Werth, Inc. this technical day dedicated to metrological solutions aroused keen interest among quality control and metrology experts. 

𝗣𝗿𝗼𝗴𝗿𝗮𝗺:

• Captivating presentations on non-contact and multisensor measurement, tomography and digitalization in metrology.
• Interactive workshops for hands-on exploration of these technologies and their benefits.
• Enriching discussions on the challenges and opportunities of optimizing productivity through metrology.
  

Many thanks to all participants for these fascinating discussions! This event reminds us of the importance of innovating and adapting to stay competitive and meet the demands of an ever-changing market. 

𝗪𝗵𝗮𝘁 𝗶𝗻𝗻𝗼𝘃𝗮𝘁𝗶𝗼𝗻𝘀 𝗮𝗿𝗲 𝘁𝗿𝗮𝗻𝘀𝗳𝗼𝗿𝗺𝗶𝗻𝗴 𝘆𝗼𝘂𝗿 𝗮𝗽𝗽𝗿𝗼𝗮𝗰𝗵 𝘁𝗼 𝗺𝗲𝘁𝗿𝗼𝗹𝗼𝗴𝘆?